This book provides the reader with a discussion of X-ray microanalysis and imaging techniques. It is meant to be an introduction for newcomers to the fields and a reference for experienced microscopists. This third edition has been largely rewritten, reflecting the huge advances in hardware and software technology. Table of I. Introduction II. Electron-specimen interaction and X-ray generation III. X-ray measurement IV. Qualitative analysis V. Quantitative analysis VI. Precision and accuracy VII. Operating conditions in the microscope VIII. Digital Processing and image math IX. Image and feature analysis X. X-ray maps and line scans XI. Application examples
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Seller: ThriftBooks-Atlanta, AUSTELL, GA, U.S.A.
Hardcover. Condition: As New. No Jacket. Pages are clean and are not marred by notes or folds of any kind. ~ ThriftBooks: Read More, Spend Less. Seller Inventory # G0964145529I2N00