Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing) - Softcover
Synopsis
The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis.
Features:
- Covers material characterization techniques and the development of advanced characterization technology
- Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints
- Discusses advanced material characterization technology in the microstructural and property characterization fields
- Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties
- Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies
This book is aimed at graduate students and researchers in materials science and engineering.
"synopsis" may belong to another edition of this title.
Other Popular Editions of the Same Title
Search results for Advanced Materials Characterization: Basic Principles,...
Stock Image
Unknown
ISBN 10: 1032375116
ISBN 13: 9781032375113
New
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 48398438-n
Stock Image
Advanced Materials Characterization
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 5 out of 5 stars
PAP. Condition: New. New Book. Shipped from UK. Established seller since 2000. Seller Inventory # GB-9781032375113
Buy New
US$ 63.73
Shipping:
US$ 5.45
From United Kingdom to U.S.A.
Quantity: 1 available
Stock Image
Unknown
ISBN 10: 1032375116
ISBN 13: 9781032375113
Used
Seller: GreatBookPrices, Columbia, MD, U.S.A.
Seller rating 5 out of 5 stars
Condition: As New. Unread book in perfect condition. Seller Inventory # 48398438
Stock Image
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Seller: Books Puddle, New York, NY, U.S.A.
Seller rating 4 out of 5 stars
Condition: New. 1st edition NO-PA16APR2015-KAP. Seller Inventory # 26403858604
Stock Image
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Seller: Majestic Books, Hounslow, United Kingdom
Seller rating 4 out of 5 stars
Condition: New. Seller Inventory # 409328499
Buy New
US$ 69.96
Shipping:
US$ 8.52
From United Kingdom to U.S.A.
Quantity: 3 available
Stock Image
Unknown
ISBN 10: 1032375116
ISBN 13: 9781032375113
New
Seller: GreatBookPricesUK, Woodford Green, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # 48398438-n
Buy New
US$ 59.92
Shipping:
US$ 19.66
From United Kingdom to U.S.A.
Quantity: Over 20 available
Seller Image
Advanced Materials Characterization
Published by
Taylor and Francis Ltd, GB, 2024
ISBN 10: 1032375116
ISBN 13: 9781032375113
New
Paperback
Seller: Rarewaves.com USA, London, LONDO, United Kingdom
Seller rating 5 out of 5 stars
Paperback. Condition: New. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. Seller Inventory # LU-9781032375113
Stock Image
Advanced Materials Characterization (Paperback)
Published by
Taylor & Francis Ltd, London, 2024
ISBN 10: 1032375116
ISBN 13: 9781032375113
New
Paperback
Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.
Seller rating 5 out of 5 stars
Paperback. Condition: new. Paperback. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. It explores the techniques implemented for advanced materials like superalloys, thin films, powders, nanocomposites, polymers, shape memory alloys, high entropy alloys, and so on. Major instruments covered include X-ray diffraction, near-field scanning optical microscopy Raman, X-ray photospectroscopy, ultraviolet-visible-near-infrared spectrosphotometer, Fourier-transform infrared spectroscopy, differential scanning calorimeter, profilometer, and thermogravimetric analysis. Features:Covers material characterization techniques and the development of advanced characterization technology Includes multiple length scale characterization approaches for a large variety of materials, from nano- to micron-scale, as well as their constraints Discusses advanced material characterization technology in the microstructural and property characterization fields Reviews both practical and theoretical explanations of approaches for characterizing microstructure and properties Offers fundamentals, basic instrumentation details, experimental approaches, analyses, and applications with case studies This book is aimed at graduate students and researchers in materials science and engineering. The book covers various methods of characterization of advanced materials commonly used in engineering including understanding of the working principle and applicability of devices. Major instruments covered include X-Ray Diffraction, NSOM Raman, X-Ray Photo Spectroscopy, UV-VIS- NIR Spectrosphotometer, FTIR Spectroscopy, and so forth. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9781032375113
Stock Image
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In. Seller Inventory # ria9781032375113_new
Buy New
US$ 67.66
Shipping:
US$ 15.70
From United Kingdom to U.S.A.
Quantity: Over 20 available
Stock Image
Advanced Materials Characterization: Basic Principles, Novel Applications, and Future Directions (Advanced Materials Processing and Manufacturing)
Seller: Chiron Media, Wallingford, United Kingdom
Seller rating 4 out of 5 stars
paperback. Condition: New. Seller Inventory # 6666-GRD-9781032375113
Buy New
US$ 63.68
Shipping:
US$ 20.30
From United Kingdom to U.S.A.
Quantity: 1 available