Modern RF and Microwave Measurement Techniques (The Cambridge RF and Microwave Engineering Series) - Hardcover

Hardcover

ISBN 10: 1107036410 ISBN 13: 9781107036413

Publisher: Cambridge University Press, 2013

Synopsis

This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and researchers. Topics covered include microwave instrumentation, such as network analysers, real-time spectrum analysis, sampling oscilloscopes and microwave synthesizers; linear measurements, such as VNA calibrations, noise figure measurements, time domain reflectometry and dielectric measurements; and non-linear measurements, such as load- and source-pull techniques, broadband signal measurements, and non-linear NVAs. Each technique is discussed in detail, and accompanied by state-of-the-art solutions to the unique technical challenges associated with its deployment. With each chapter delivered by internationally recognised experts in the field, this is an invaluable resource for researchers and professionals involved with microwave measurements.

About this title

About the Authors

Valeria Teppati is a Researcher in the Millimeter Wave Electronics Group of the Department of Information Technology and Electrical Engineering at ETH Zurich, developing innovative solutions to aspects of linear and non-linear measurement techniques.

Andrea Ferrero is a Professor in the RF, Microwave and Computational Electronics group of the Department of Electronics and Telecommunications at Politecnico di Torino. He is a Distinguished Microwave Lecturer of the IEEE Microwave Theory and Techniques Society, and a Fellow of the IEEE.

Mohamed Sayed is the Principal Consultant for Microwave and Millimeter Wave Solutions and has nearly 30 years' experience of developing microwave and millimetre wave systems for Hewlett-Packard Co. and Agilent Technologies Inc.

Edition details

• Publisher: Cambridge University Press
• Publication date: 2013
• Language: English
• ISBN 10: 1107036410
• ISBN 13: 9781107036413
• Binding: Hardcover
• Edition number: 1
• Number of pages: 471
• Editor: Teppati Valeria, Ferrero Andrea, Sayed Mohamed