VLSI Test Principles and Architectures: Design for Testability - Softcover

Wang, Laung-Terng; Wu, Cheng-Wen; Wen, Xiaoqing

Softcover

ISBN 10: 1493300865 ISBN 13: 9781493300860

Publisher: Morgan Kaufmann, 2006

Synopsis

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume.

· Most up-to-date coverage of design for testability.
· Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books.
· Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures.
· Lecture slides and exercise solutions for all chapters are now available.
· Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.

About this title

About the Author

Laung-Terng Wang, Ph.D., is founder, chairman, and chief executive officer of SynTest Technologies, CA. He received his EE Ph.D. degree from Stanford University. A Fellow of the IEEE, he holds 18 U.S. Patents and 12 European Patents, and has co-authored/co-edited two internationally used DFT textbooks- VLSI Test Principles and Architectures (2006) and System-on-Chip Test Architectures (2007).

Edition details

• Publisher: Morgan Kaufmann
• Publication date: 2006
• Language: English
• ISBN 10: 1493300865
• ISBN 13: 9781493300860
• Binding: Paperback
• Edition number: 1
• Number of pages: 808