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Synopsis
Smart card transaction times will increase as the number of bits used in the algorithms protecting the cards to ensure security increases. This is a potential problem for the Department of Defense, which requires smart card usage for its employees. This book defines, compares, and contrasts two algorithms: Rivest-Shamir-Adleman (RSA) and Elliptic Curve Cryptography (ECC), and then provides test data for encryption algorithms tested on particular certification key processes in an attempt to show that the ECC encryption algorithm provides the security necessary for smart card operations at a fast enough speed to benefit smart card users. It describes the Open Protocol for Access Control Identification and Ticketing with privacy (OPACITY) pilot project that took place over 2014 in relation to the card testing, and hypothesizes the risks and mitigation factors for the Department of Defense to permanently switch to the ECC algorithm for smart card use.
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Time Delay Measurements of Key Generation Process on Smart Cards
Published by
CreateSpace Independent Publishing Platform, 2015
ISBN 10: 1522955399
ISBN 13: 9781522955399
New
Softcover
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # ABLIING23Mar2716030310529
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Time Delay Measurements of Key Generation Process on Smart Cards
Published by
CreateSpace Independent Publishing Platform, 2015
ISBN 10: 1522955399
ISBN 13: 9781522955399
New
Softcover
Seller: California Books, Miami, FL, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Print on Demand. Seller Inventory # I-9781522955399
Quantity: Over 20 available
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Time Delay Measurements of Key Generation Process on Smart Cards
Published by
Createspace Independent Publishing Platform, 2015
ISBN 10: 1522955399
ISBN 13: 9781522955399
New
Paperback / softback
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 118. Seller Inventory # C9781522955399
Quantity: Over 20 available
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Time Delay Measurements of Key Generation Process on Smart Cards (Paperback)
Published by
Createspace Independent Publishing Platform, 2015
ISBN 10: 1522955399
ISBN 13: 9781522955399
New
Paperback
Seller: CitiRetail, Stevenage, United Kingdom
Seller rating 5 out of 5 stars
Paperback. Condition: new. Paperback. Smart card transaction times will increase as the number of bits used in the algorithms protecting the cards to ensure security increases. This is a potential problem for the Department of Defense, which requires smart card usage for its employees. This book defines, compares, and contrasts two algorithms: Rivest-Shamir-Adleman (RSA) and Elliptic Curve Cryptography (ECC), and then provides test data for encryption algorithms tested on particular certification key processes in an attempt to show that the ECC encryption algorithm provides the security necessary for smart card operations at a fast enough speed to benefit smart card users. It describes the Open Protocol for Access Control Identification and Ticketing with privacy (OPACITY) pilot project that took place over 2014 in relation to the card testing, and hypothesizes the risks and mitigation factors for the Department of Defense to permanently switch to the ECC algorithm for smart card use. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Seller Inventory # 9781522955399
Quantity: 1 available