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Recent Developments in Oxide and Metal Epitaxy – Theory and Experiment: Volume 619 (MRS Proceedings) - Hardcover

 
9781558995277: Recent Developments in Oxide and Metal Epitaxy – Theory and Experiment: Volume 619 (MRS Proceedings)

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Thin-film epitaxy is integral to many current and emerging technologies, and continued progress in solving critical issues is essential to the realization of new devices. This book, first published in 2000, focuses on progress in solving fundamental issues in the epitaxial growth of metals and oxides. Insights from both experiment, and modeling are combined to facilitate cross fertilization of ideas and understanding. Highlighted is the use of in situ characterization techniques for enhancing the efficiency of materials development. Thin-film research is often empirical in nature. Techniques for minimizing the time spent exploring the complex parameter space in order to optimize growth and processing conditions are of particular value. Among the techniques discussed are spectroscopic ellipsometry and ion scattering and recoil spectrometry, LEEM (low-energy electron microscopy), STM (scanning tunneling microscopy), TEM (transmission electron microscopy) and RHEED (reflection high-energy electron diffraction). Topics include: growth and dynamics of metal films; structure and oxidation of metal films and surfaces; in situ studies of oxide growth and epitaxial growth of oxides.

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Thin-film epitaxy is integral to many current and emerging technologies, and continued progress in solving critical issues is essential to the realization of new devices. This book, first published in 2000, focuses on progress in solving fundamental issues in the epitaxial growth of metals and oxides.

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9781107413085: Recent Developments in Oxide and Metal Epitaxy – Theory and Experiment: Volume 619 (MRS Proceedings)

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ISBN 10:  1107413087 ISBN 13:  9781107413085
Publisher: Cambridge University Press, 2014
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MARK YEADON, NATIONAL UNIVERSITY OF SINGAPORESHIRLEY CHIANG, UNIVERSITY OF CALIFORNIA, DAVISROBIN F. C. FARROW, IBM ALMADEN RESEARCH CENTER, NEW YORKJAMES W. EVANS, IOWA STATE UNIVERSITYORLANDO AUCIELLO, ARGONNE NATIONAL LABORATORY, ILLINOIS
Published by Cambridge University Press, 2000
ISBN 10: 1558995277 ISBN 13: 9781558995277
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Yeadon, Mark
Published by Cambridge University Press, 2000
ISBN 10: 1558995277 ISBN 13: 9781558995277
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