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Production Testing of Rf and System-on-a-Chip Devices for Wireless Communications (Artech House Microwave Library (Hardcover)) - Softcover
Synopsis
With the increasing number of integrated wireless devices being developed with Soc (system on a chip) technology, a merger of Rf and mixed-signal test approaches is quickly becoming a necessity. Addressing this need head-on, this first-of-its-kind resource offers you an in-depth overview of Rf and Soc product testing for wireless communications. The book introduces new, creative methods that lead to more efficient testing, such as multi-site and parallel testing. You learn how to determine critical measurements for specific applications, including Bluetooth, Wlan, and 3G devices. Moreover, the book shows you how to perform these measurements cost effectively in a production test environment. This hands-on reference provides you with the time-saving algorithms and practical techniques you need to handle your challenging projects with speed and confidence. The book also offers a thorough understanding of the capital expenditures involved in production testing, to help you make sound investment decisions. You discover a cost-of-test model that helps you compare and contrast production testing methods with ease.
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About the Author
Keith B. Schaub is a Wireless Center of Expertise Senior RF technical consultant at Agilent Technologies. Mr. Schaub has over 10 years of professional engineering experience and received his M.S. in Electrical Engineering from the University of Texas.
Joe Kelly is a Wireless Center of Expertise Senior RF technical consultant at Agilent Technologies. Dr. Kelly earned his Ph.D. and M.S. in Ceramic and Materials Engineering at Rutgers University. He is a frequent presenter at international conferences and workshops.
"About this title" may belong to another edition of this title.
- PublisherArtech House
- Publication date2004
- ISBN 10 1580536921
- ISBN 13 9781580536929
- BindingPaperback
- LanguageEnglish
- Number of pages272
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