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Synopsis
With a focus on the use of materials characterization techniques for silicon-based semiconductors, this volume in the Materials Characterization series focuses on the process flow of silicon wafer manufacture where materials properties, processing and ass
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About the Author
Yale E. Strausser
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- PublisherMomentum Press
- Publication date2010
- ISBN 10 1606501097
- ISBN 13 9781606501092
- BindingHardcover
- LanguageEnglish
- Number of pages240
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Characterization in Silicon Processing (AGENCY/DISTRIBUTED) [Hardcover] Yale E. Strausser (author)
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Characterization In Silicon Processing
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