Key Concepts of Scanning Electron Microscopy - Hardcover

Hardcover

ISBN 10: 1632383063 ISBN 13: 9781632383068

Publisher: NY RESEARCH PRESS, 2015

Synopsis

This book on scanning electron microscopy examines the key concepts employed in the field. Fine focused electron and ion beams constitute(s) an inevitable part of methods and instruments employed in various science fields. SEMs are well instrumented and supplemented with advanced techniques and methods and thereby present endless possibilities in the areas of quantitative measurement of object topologies, surface imaging, performing elemental analysis and local electrophysical characteristics of semiconductor structures. Creation of micro and nanostructures involves extensive use of fine focused e-beam. This book focuses on various issues concerned with scanning electron microscopy, covering both theoretical and practical applications. It further includes numerous topics on geoscience, instrumentation, mineralogy, thin films, biology, ceramic and materials for electronic industry. This book includes contributions by renowned researchers and experts in this field.

Edition details

• Publisher: NY RESEARCH PRESS
• Publication date: 2015
• Language: English
• ISBN 10: 1632383063
• ISBN 13: 9781632383068
• Binding: Hardcover
• Number of pages: 256
• Editor: Page Lisa