Items related to An Introduction to Time-of-Flight Secondary Ion Mass...
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics) - Softcover
Synopsis
This book highlights the application of Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) for high-resolution surface analysis and characterization of materials. While providing a brief overview of the principles of SIMS, it also provides examples of how dual-beam ToF-SIMS is used to investigate a range of materials systems and properties.
Over the years, SIMS instrumentation has dramatically changed since the earliest secondary ion mass spectrometers were first developed. Instruments were once dedicated to either the depth profiling of materials using high-ion-beam currents to analyse near surface to bulk regions of materials (dynamic SIMS), or time-of-flight instruments that produced complex mass spectra of the very outer-most surface of samples, using very low-beam currents (static SIMS). Now, with the development of dual-beam instruments these two very distinct fields now overlap.
"synopsis" may belong to another edition of this title.
About the Author
Dr. Sarah Fearn is a Research Officer, Surface Analysis, in the Materials Department at Imperial College London where she conducts near-surface analysis of SOFCs and ionic conductivity measurements on nano-engineered structures. Her current research techniques include: isotope exchange, secondary ion mass spectrometry (SIMS), focused ion beam (FIB) microscopy, and low-energy ion scattering (LEIS). She received her PhD in 1999 from Imperial College London and spent nearly two years as a commercial SIMS analyst with Cascade Scientific before joining ICL in 2002.
"About this title" may belong to another edition of this title.
- PublisherMorgan & Claypool
- Publication date2015
- ISBN 10 1681740249
- ISBN 13 9781681740249
- BindingPaperback
- LanguageEnglish
- Number of pages66
Other Popular Editions of the Same Title
Search results for An Introduction to Time-of-Flight Secondary Ion Mass...
Stock Image
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)
Seller: suffolkbooks, Center moriches, NY, U.S.A.
Seller rating 5 out of 5 stars
paperback. Condition: Very Good. Fast Shipping - Safe and Secure 7 days a week! Seller Inventory # 3TWOWA001MK4
Quantity: 1 available
Stock Image
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)
Seller: Lucky's Textbooks, Dallas, TX, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # ABLING22Oct1111410215818
Quantity: Over 20 available
Stock Image
An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science (Paperback or Softback)
Published by
Morgan & Claypool 10/16/2015, 2015
ISBN 10: 1681740249
ISBN 13: 9781681740249
New
Paperback or Softback
Seller: BargainBookStores, Grand Rapids, MI, U.S.A.
Seller rating 5 out of 5 stars
Paperback or Softback. Condition: New. An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science 0.4. Book. Seller Inventory # BBS-9781681740249
Quantity: 5 available
Stock Image
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)
Seller: California Books, Miami, FL, U.S.A.
Seller rating 5 out of 5 stars
Condition: New. Seller Inventory # I-9781681740249
Quantity: Over 20 available
Stock Image
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Published by
Morgan and Claypool Publishers, 2015
ISBN 10: 1681740249
ISBN 13: 9781681740249
New
PAP
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
Seller rating 5 out of 5 stars
PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # IQ-9781681740249
Quantity: 15 available
Stock Image
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science
Published by
Morgan and Claypool Publishers, 2015
ISBN 10: 1681740249
ISBN 13: 9781681740249
New
PAP
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
Seller rating 4 out of 5 stars
PAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # IQ-9781681740249
Quantity: 15 available
Stock Image
An Introduction to Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-Sims) and Its Application to Materials Science
Seller: Russell Books, Victoria, BC, Canada
Seller rating 5 out of 5 stars
Softcover. Condition: New. Special order direct from the distributor. Seller Inventory # ING9781681740249
Quantity: Over 20 available
Stock Image
An Introduction to Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and its Application to Materials Science (Iop Concise Physics)
Seller: Ria Christie Collections, Uxbridge, United Kingdom
Seller rating 5 out of 5 stars
Condition: New. In. Seller Inventory # ria9781681740249_new
Quantity: Over 20 available
Stock Image
Introduction to Time-of-Flight Secondary Ion Mass Spectrometry
Published by
Morgan & Claypool Publishers, 2015
ISBN 10: 1681740249
ISBN 13: 9781681740249
New
Paperback / softback
Seller: THE SAINT BOOKSTORE, Southport, United Kingdom
Seller rating 5 out of 5 stars
Paperback / softback. Condition: New. This item is printed on demand. New copy - Usually dispatched within 5-9 working days 254. Seller Inventory # C9781681740249
Quantity: Over 20 available
Stock Image
An Introduction to Time-of-flight Secondary Ion Mass Spectrometry and Its Application to Materials Science
Seller: Revaluation Books, Exeter, United Kingdom
Seller rating 5 out of 5 stars
Paperback. Condition: Brand New. 66 pages. 10.00x7.00x0.25 inches. In Stock. Seller Inventory # x-1681740249
Quantity: 2 available