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Quantum Metrology with Photoelectrons: Volume II: Applications and Advances (Iop Concise Physics) - Softcover
Synopsis
Since the turn of the century, the increasing availability of photoelectron imaging experiments, along with the increasing sophistication of experimental techniques, and the availability of computational resources for analysis and numerics, has allowed for significant developments in such photoelectron metrology. Quantum Metrology with Photoelectrons, Volume 2: Applications and Advances discusses the fundamental concepts along with recent and emerging applications.
Volume 2 explores the applications and development of quantum metrology schemes based on photoelectron measurements. The author begins with a brief historical background on "complete" photoionization experiments, followed by the details of state reconstruction methodologies from experimental measurements. Three specific applications of quantum metrology schemes are discussed in detail. In addition, the book provides advances, future directions, and an outlook including (ongoing) work to generalise these schemes and extend them to dynamical many-body systems. Volume 2 will be of interest to readers wishing to see the (sometimes messy) details of state reconstruction from photoelectron measurements as well as explore the future prospects for this class of metrology.
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About the Author
Paul Hockett earned his PhD in 2008 from the University of Nottingham, UK and joined the National Research Council of Canada in 2009. Paul's research interests cover a range of topics spanning the areas of AMO (atomic, molecular, and optical), quantum, and computational physics (and physical chemistry), with a particular focus on fundamental light-matter interactions, spectroscopy, and application to complex systems.
"About this title" may belong to another edition of this title.
- PublisherIop Concise Physics
- Publication date2018
- ISBN 10 1681746891
- ISBN 13 9781681746890
- BindingPaperback
- LanguageEnglish
- Number of pages125
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