Reliability, Robustness and Failure Mechanisms of LED Devices: Methodology and Evaluation - Hardcover

Deshayes, Yannick; Bechou, Laurent

Hardcover

ISBN 10: 1785481525 ISBN 13: 9781785481529

Publisher: ISTE Press - Elsevier, 2016

Synopsis

The rapid growth of the use of optoelectronic technology in Information and Communications Technology (ICT) has seen a complementary increase in the performance of such technologies. As a result, optoelectronic technologies have replaced the technology of electronic interconnections. However, the control of manufacturing techniques for optoelectronic systems is more delicate than that of microelectronic technologies.This practical resource, divided into four chapters, examines several methods for determining the reliability of infrared LED devices. The primary interest of this book focuses on methods of extracting fundamental parameters from the electrical and optical characterization of specific zones in components. Failure mechanisms are identified based on measured performance before and after aging tests. Knowledge of failure mechanisms allows formulation of degradation laws, which in turn allow an accurate lifetime distribution for specific devices to be proposed.

• Deals exclusively with reliability, based on the physics of failure for infrared LEDs
• Identifies failure mechanisms, lifetime distribution, and selection of the best component for dedicated applications
• Uses a complete methodology to reduce the number of samples needed to estimate lifetime distribution
• Focuses on the method to extract fundamental parameters from electrical and optical characterizations

About this title

About the Authors

Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices. He develops quantum theory to establish degradation laws on photonics devices for LED, laser and photonics applications..

Laurent Béchou is Full Professor in Electronics and Physics at the University of Bordeaux, France, and Visiting Senior Researcher at the Laboratoire Nanotechnologies et Nanosystčmes (CNRS) at the University of Sherbrooke, Canada. His research mainly addresses advanced electro-optical characterization techniques, physical and failure mechanisms modeling, as well as statistical methods for lifetime prediction of optical devices and emerging photonic systems.

Edition details

• Publisher: ISTE Press - Elsevier
• Publication date: 2016
• Language: English
• ISBN 10: 1785481525
• ISBN 13: 9781785481529
• Binding: Hardcover
• Edition number: 1
• Number of pages: 172