This book describes in detail mathematical methods, which lead to suitable characteristics for pattern recognition. It deals with various classifiers and classification methods. Emphasis is on the performance of classifiers and the processing chain: problem-pattern-feature classifier. Parameter estimation, classification on the basis of qualitative characteristics, overfitting and other features are discussed.
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Jürgen Beyerer, Matthias Richter, Matthias Nagel, Fraunhofer Institute Karlsruhe, Germany.
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