Handbook of Microscopy, Handbook of Microscopy: Applications in Materials Science, Solid-State Physics, and Chemistry. Methods II - Softcover

Softcover

ISBN 10: 3527294732 ISBN 13: 9783527294732

Publisher: Wiley-VCH, 1996

Synopsis

Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information.

With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which techique is suitable for characterizing a given material?"

About this title

From the Back Cover

Handbook of Microscopy Applications in Materials Science, Solid-State Physics and Chemistry Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Comprehensive in coverage, written and edited by leading experts in the field, this Handbook is a definitive, up-to-date reference work. The Volumes Methods I and Methods II detail the physico-chemical basis and capabilities of the various microscopy techniques used in materials science. The Volume Applications illustrates the results obtained by all available methods for the main classes of materials, showing which technique can be successfully applied to a given material in order to obtain the desired information. With the Handbook of Microscopy, scientists and engineers involved in materials characterization will be in a position to answer two key questions: "How does a given technique work?", and "Which technique is suitable for characterizing a given material?" From the Contents: Electron Microscopy: Scanning Beam Methods, Magnetic Methods: NMR-Microscopy, Scanning Electron Microscopy with Polarization Analysis (SEMPA). Emission Methods: Photoemission Electron Microscopy, Field Emission Microscopy (FEM), Field Ion Microscopy. Scanning Point Probe Techniques: Scanning Tunnelling Microscopy STM, Atomic Force Microscopy AFM, Magnetic Force Microscopy MFM, Ballistic Electron Emission Microscopy (BEEM), Methods Under Development. Image Recording, Handling and Processing: Electronic Image Recording. Image Processing Special Topics: Coincidence Microscopy, Low Energy Holography.

Edition details

• Publisher: Wiley-VCH
• Publication date: 1996
• ISBN 10: 3527294732
• ISBN 13: 9783527294732
• Binding: Paperback
• Language: English
• Edition number: 1
• Number of pages: 507
• Editor: Amelinckx S., Van Dyck Dirk, Van Landuyt J., Van Tendeloo Gustaaf