Items related to Electron Microscopy: Principles and Fundamentals
Synopsis
Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research.
Topics include:
* Stationary Beam Methods: Transmission Electron Microscopy/ Electron Energy Loss Spectroscopy/ Convergent Electron Beam Diffraction/ Low Energy Electron Microscopy/ Electron Holographic Methods
* Scanning Beam Methods: Scanning Transmission Electron Microscopy/ Scanning Auger and XPS Microscopy/ Scanning Microanalysis/ Imaging Secondary Ion Mass Spectrometry
* Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/ Spin Polarized Low Energy Electron Microscopy
Materials scientists as well as any surface scientist will find this book an invaluable source of information for the principles of electron microscopy.
"synopsis" may belong to another edition of this title.
From the Back Cover
Electron Microscopy Principles and Fundamentals Edited by S. Amelinckx, D. van Dyck, J. van Landuyt, G. van Tendeloo Derived from the successful three-volume Handbook of Microscopy, this book provides a broad survey of the physical fundamentals and principles of all modern techniques of electron microscopy. This reference work on the method most often used for the characterization of surfaces offers a competent comparison of the feasibilities of the latest developments in this field of research. Topics include:
- Stationary Beam Methods: Transmission Electron Microscoy/Electron Energy Loss Spectroscopy/Convergent Electron Beam Diffraction/Low Energy Electron Microscopy/Electron Holographic Methods
- Scanning Beam Methods: Scanning Transmission Electron Microscopy/Scanning Auger and XPS Microscopy/Scanning Microanalysis/Imaging Secondary Ion Mass Spectrometry
- Magnetic Microscopy: Scanning Electron Microscopy with Polarization Analysis/Spin Polarized Low Energy Electron Microscopy
"About this title" may belong to another edition of this title.
- PublisherWiley-VCH
- Publication date1997
- ISBN 10 3527294791
- ISBN 13 9783527294794
- BindingHardcover
- LanguageEnglish
- Edition number1
- Number of pages527
- EditorAmelinckx S., Van Dyck Dirk, Van Landuyt J., Van Tendeloo Gustaaf
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Electron Microscopy : Principles and Fundamentals
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Condition: Sehr gut. Zustand: Sehr gut | Seiten: 560 | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 253534/202
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Electron Microscopy : Principles and Fundamentals
Seller: Buchpark, Trebbin, Germany
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Condition: Gut. Zustand: Gut | Seiten: 560 | Sprache: Englisch | Produktart: Bücher. Seller Inventory # 253534/203
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Electron Microscopy: Principles and Fundamentals
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Condition: Good. Good+; Hardcover; Withdrawn library copy with the standard library markings; Light wear to the covers; Library stamps to the endpapers; Text pages are clean & unmarked; Binding is excellent with a straight spine; This book will be shipped in a sturdy cardboard box with foam padding; Medium Format (8.5" - 9.75" tall); White and blue covers with title in black lettering; 1997, Wiley-VCH Publishing; 527 pages; "Electron Microscopy: Principles and Fundamentals," by Edited by: S. Amelinckx. Seller Inventory # SKU-105BC01010171
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Electron Microscopy: Principles and Fundamentals
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