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Advanced Characterization Techniques for Thin Film Solar Cells - Hardcover

 
9783527339921: Advanced Characterization Techniques for Thin Film Solar Cells
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The book focuses on advanced characterization methods for thin-film solar cells that have proven their relevance both for academic and corporate photovoltaic research and development. After an introduction to thin-film photovoltaics, highly experienced experts report on device and materials characterization methods such as electroluminescence analysis, capacitance spectroscopy, and various microscopy methods. In the final part of the book simulation techniques are presented which are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D, 2D and 3D.

Building on a proven concept, this new edition also covers thermography, transient optoelectronic methods, and absorption and photocurrent spectroscopy.

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Written by scientists from leading institutes in Germany, USA, Spain, Sweden, Poland, and Israel who use these techniques as the core of their scientific work and who have a precise idea of what is relevant for photovoltaic devices, this text contains concise and comprehensive lecture-like chapters on specific research methods.

The choice of subjects is a representative cross-section of those methods enjoying a high degree of visibility in recent scientific literature. A clear introductory chapter describes the basic physics of thin-film solar cells and modules, providing a guide to the specific advantages that are offered by each individual method. Furthermore, the handbook deals with specific device-related topics and includes a selection of material and surface/interface analysis methods that have recently proven their relevance.

Finally, simulation techniques are presented that are used for ab-initio calculations of relevant semiconductors and for device simulations in 1D and 2D.

For students in physics, electrical engineering, and material sciences, solid state physicists, electrical engineers, materials scientists, semiconductor physicists, scientists working at materials research institutes, and those working in the semiconductor industry. Also suitable as supplementary reading in related courses.

About the Author:
Daniel Abou-Ras is senior scientist at the Helmholtz Center Berlin for Materials and Energy, Germany. He obtained his PhD at ETH Zurich, Switzerland. In 2005, he was awarded the MRS Graduate Student Gold Award at the MRS Spring Meeting. His research interests are correlative approaches in scanning as well as transmission electron microscopy, mainly applied on semiconductor devices.

Thomas Kirchartz is professor in the Department of Electrical Engineering and Information
Technology at the University Duisburg-Essen and head of the Division for Organic and Hybrid Solar Cells at the Institute of Energy and Climate Research 5 ? Photovoltaics at the Research Center Julich, Germany. Previously he was Junior Research Fellow in the Department of Physics at Imperial College London, UK. He obtained his degree in Electrical Engineering and Information Technology from the University of Stuttgart, Germany, in 2006 and his PhD from the RWTH Aachen, Germany, in 2009.

Uwe Rau is full professor at the Faculty Electrical Engineering and Computer Science of the RWTH Aachen, Germany, since 2007 and head of the Institute of Energy and Climate Research 5 ? Photovoltaics at the Research Center Julich, Germany. He obtained his PhD 1991 from the University Tubingen and was scientific group leader from 1995?2007 at the Universities of Bayreuth and Stuttgart.

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9783527410033: Advanced Characterization Techniques for Thin Film Solar Cells

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