Items related to Modeling and Multiresolution Characterization of Micro/nano...
Modeling and Multiresolution Characterization of Micro/nano Surface: for Polymer Thin Films and Interfaces - Softcover
Various statistical features can be used to characterize the surface in quantitative way. Such an analysis can be done by the multi-resolution capabilities of wavelet transforms (WT) of the surface microscopic image. A multi-scale molecular model can help to investigate the physical and chemical mechanism in manufacturing process. Multiresolution characterization can be performed on the model structure to compare with image analysis. In this book, we have used a soft polymeric surface and applied multiresolution characterization for surface feature extraction and multiscale modeling for optimizing system variables to get desired surface characteristics. In microfabrication, the efficiency of the product reduced by line-edge roughness (LER). Off-line LER characterization is usually based on the top-down SEM image. This book shows wavelet based segmentation method for edge searching region as well as wavelet based characterization. For mesoscale modeling, the Flory-Huggins interaction parameters of the clusters of atoms or molecules are used. We have identified the phase separation by spinodal decomposition resulting in the formation of LER on polymer surface.
"synopsis" may belong to another edition of this title.
About the Author:
Rajib Mukherjee: BTech (AU College of Eng.), 1997 and MTech (IIT Kanpur), India, 1999 both in chemical engineering. He also earned MS (2008) and PhD (2010) from the Dept. of Chem. Eng. at LSU. At present he is post doctoral researcher at the Center for Computational Science, Tulale University. Dr. Jose A Romagnoli: professor of Chem. Eng. (LSU).
"About this title" may belong to another edition of this title.
- PublisherVDM Verlag Dr. Müller
- Publication date2010
- ISBN 10 3639266129
- ISBN 13 9783639266122
- BindingPaperback
- Number of pages124
Buy New
Learn more about this copy
US$ 60.62
Shipping:
US$ 3.99
Within U.S.A.
Top Search Results from the AbeBooks Marketplace
Stock Image
Modeling and Multiresolution Characterization of Micro/nano Surface: for Polymer Thin Films and Interfaces
Published by
VDM Verlag Dr. Müller
(2010)
ISBN 10: 3639266129
ISBN 13: 9783639266122
New
Softcover
Quantity: 19
Seller:
Rating
Book Description Condition: New. Seller Inventory # ABLIING23Mar3113020190577
Buy New
US$ 60.62
Convert currency
Stock Image
Modeling and Multiresolution Characterization of Micro/nano Surface
Published by
VDM Verlag
(2010)
ISBN 10: 3639266129
ISBN 13: 9783639266122
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9783639266122_lsuk
Buy New
US$ 67.46
Convert currency
Stock Image
Modeling and Multiresolution Characterization of Micro/nano Surface
Published by
VDM Verlag 2010-07
(2010)
ISBN 10: 3639266129
ISBN 13: 9783639266122
New
PF
Quantity: 10
Seller:
Rating
Book Description PF. Condition: New. Seller Inventory # 6666-IUK-9783639266122
Buy New
US$ 64.07
Convert currency
Stock Image
Modeling and Multiresolution Characterization of Micronano Surface for Polymer Thin Films and Interfaces
Published by
VDM Verlag Dr. Müller
(2010)
ISBN 10: 3639266129
ISBN 13: 9783639266122
New
PAP
Quantity: > 20
Seller:
Rating
Book Description PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # L0-9783639266122
Buy New
US$ 87.17
Convert currency
Seller Image
Modeling and Multiresolution Characterization of Micro/nano Surface
Published by
VDM Verlag Dr. Müller
(2010)
ISBN 10: 3639266129
ISBN 13: 9783639266122
New
Taschenbuch
Quantity: 2
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -Various statistical features can be used to characterize the surface in quantitative way. Such an analysis can be done by the multi-resolution capabilities of wavelet transforms (WT) of the surface microscopic image. A multi-scale molecular model can help to investigate the physical and chemical mechanism in manufacturing process. Multiresolution characterization can be performed on the model structure to compare with image analysis. In this book, we have used a soft polymeric surface and applied multiresolution characterization for surface feature extraction and multiscale modeling for optimizing system variables to get desired surface characteristics. In microfabrication, the efficiency of the product reduced by line-edge roughness (LER). Off-line LER characterization is usually based on the top-down SEM image. This book shows wavelet based segmentation method for edge searching region as well as wavelet based characterization. For mesoscale modeling, the Flory-Huggins interaction parameters of the clusters of atoms or molecules are used. We have identified the phase separation by spinodal decomposition resulting in the formation of LER on polymer surface. 124 pp. Englisch. Seller Inventory # 9783639266122
Buy New
US$ 65.04
Convert currency
Seller Image
Modeling and Multiresolution Characterization of Micro/nano Surface : for Polymer Thin Films and Interfaces
Published by
VDM Verlag Dr. Müller
(2010)
ISBN 10: 3639266129
ISBN 13: 9783639266122
New
Taschenbuch
Quantity: 2
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. nach der Bestellung gedruckt Neuware - Printed after ordering - Various statistical features can be used to characterize the surface in quantitative way. Such an analysis can be done by the multi-resolution capabilities of wavelet transforms (WT) of the surface microscopic image. A multi-scale molecular model can help to investigate the physical and chemical mechanism in manufacturing process. Multiresolution characterization can be performed on the model structure to compare with image analysis. In this book, we have used a soft polymeric surface and applied multiresolution characterization for surface feature extraction and multiscale modeling for optimizing system variables to get desired surface characteristics. In microfabrication, the efficiency of the product reduced by line-edge roughness (LER). Off-line LER characterization is usually based on the top-down SEM image. This book shows wavelet based segmentation method for edge searching region as well as wavelet based characterization. For mesoscale modeling, the Flory-Huggins interaction parameters of the clusters of atoms or molecules are used. We have identified the phase separation by spinodal decomposition resulting in the formation of LER on polymer surface. Seller Inventory # 9783639266122
Buy New
US$ 65.82
Convert currency
Seller Image
Modeling and Multiresolution Characterization of Micro/nano Surface
Published by
VDM Verlag Dr. Müller
(2010)
ISBN 10: 3639266129
ISBN 13: 9783639266122
New
Kartoniert / Broschiert
Quantity: > 20
Seller:
Rating
Book Description Kartoniert / Broschiert. Condition: New. Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. Autor/Autorin: Mukherjee RajibRajib Mukherjee: BTech (AU College of Eng.), 1997 and MTech (IIT Kanpur), India, 1999 both in chemical engineering. He also earned MS (2008) and PhD (2010) from the Dept. of Chem. Eng. at LSU. At present he is post d. Seller Inventory # 4972331
Buy New
US$ 51.06
Convert currency
Stock Image
Modeling and Multiresolution Characterization of Micronano Surface for Polymer Thin Films and Interfaces
Published by
VDM Verlag Dr. Müller
(2010)
ISBN 10: 3639266129
ISBN 13: 9783639266122
New
PAP
Quantity: > 20
Seller:
Rating
Book Description PAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # L0-9783639266122
Buy New
US$ 72.28
Convert currency