Integrated Digital Thermometer in a BiCMOS Technology

 
9783659433375: Integrated Digital Thermometer in a BiCMOS Technology

In this work, an integrated digital thermometer was designed at transistor level in 0.18μm BiCMOS SiGe technology for a temperature range of -50 ?C to 130 ?C. The 1σ accuracy achieved at 100 ?C is 1.21 ?C. The digital thermometer consists of temperature sensor, Instrumentation amplifier (pre-amplifier), Sample-and-Hold, Comparator, Successive Approximation Register (SAR) and Digital-to-Analog Converter (DAC). The ADC designed is a successive approximation register (SAR) ADC having a sampling rate of 5 kS/s at 3V. The main thrust of this work was to have a minimum error. As the major error source is the sensor, three different sensor topologies were designed, tested and evaluated for minimum error and size. Monte Carlo simulations were performed to check for the process and mismatch variations. The data from Monte Carlo simulation was then used to measure the error.

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Received BS in Computer Engineering from COMSATS institute of information technology, Pakistan in 2007 and MS in Wireless Networks & Electronics from Linköping University, Sweden in 2013.

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Book Description LAP Lambert Academic Publishing, United States, 2013. Paperback. Book Condition: New. 220 x 150 mm. Language: English . Brand New Book ***** Print on Demand *****.In this work, an integrated digital thermometer was designed at transistor level in 0.18 m BiCMOS SiGe technology for a temperature range of -50 C to 130 C. The 1 accuracy achieved at 100 C is 1.21 C. The digital thermometer consists of temperature sensor, Instrumentation amplifier (pre-amplifier), Sample-and-Hold, Comparator, Successive Approximation Register (SAR) and Digital-to-Analog Converter (DAC). The ADC designed is a successive approximation register (SAR) ADC having a sampling rate of 5 kS/s at 3V. The main thrust of this work was to have a minimum error. As the major error source is the sensor, three different sensor topologies were designed, tested and evaluated for minimum error and size. Monte Carlo simulations were performed to check for the process and mismatch variations. The data from Monte Carlo simulation was then used to measure the error. Bookseller Inventory # AAV9783659433375

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Book Description LAP LAMBERT Academic Publishing. Paperback. Book Condition: New. Paperback. 124 pages. Dimensions: 8.7in. x 5.9in. x 0.3in.In this work, an integrated digital thermometer was designed at transistor level in 0. 18m BiCMOS SiGe technology for a temperature range of -50 C to 130 C. The 1 accuracy achieved at 100 C is 1. 21 C. The digital thermometer consists of temperature sensor, Instrumentation amplifier (pre-amplifier), Sample-and-Hold, Comparator, Successive Approximation Register (SAR) and Digital-to-Analog Converter (DAC). The ADC designed is a successive approximation register (SAR) ADC having a sampling rate of 5 kSs at 3V. The main thrust of this work was to have a minimum error. As the major error source is the sensor, three different sensor topologies were designed, tested and evaluated for minimum error and size. Monte Carlo simulations were performed to check for the process and mismatch variations. The data from Monte Carlo simulation was then used to measure the error. This item ships from multiple locations. Your book may arrive from Roseburg,OR, La Vergne,TN. Paperback. Bookseller Inventory # 9783659433375

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