Items related to 半導体デバイス...
Search results for 半導体デバイス...
Seller Image
Semiconductor Device Failure/Fault Analysis Technology (Reliability Technology Series) (Japanese Language Book)
ISBN 10: 4817196858
ISBN 13: 9784817196859
New
Seller: Hakone Books, Fujisawa, KANAG, Japan
Seller rating 5 out of 5 stars
Condition: New. This essential volume, part of the Reliability Technology Series, delves into the critical methodologies and techniques for analyzing defects and failures in semiconductor devices. Published by Nikka Giren Publishing, it offers in-depth insights for professionals and researchers in electronics, manufacturing, and quality control seeking to enhance device reliability and performance. The book covers various analytical approaches, providing a comprehensive resource for understanding and resolving common and complex issues in semiconductor technology. Note: The text is entirely in Japanese. Brand New Japanese Edition. Ships worldwide from Japan via Japan Post. Expedited shipping via FedEx available. Seller Inventory # AB-9784817196859