This comprehensive book offers an in-depth exploration of the essential methodologies in single-crystal X-ray diffraction (SCXRD) and structural crystallography. It provides a clear, step-by-step pathway from the acquisition of raw diffraction data to the final validation of refined crystal structures. Beginning with the principles of data collection and reflection indexing, the book guides readers through the intricacies of data treatment, quality assessment, and symmetry determination. Special emphasis is placed on best practices for applying space-group analysis, refining atomic models, and ensuring the reliability of structural results.Designed to serve both as a teaching tool and a reference work, this volume is intended for graduate students, researchers, and professionals in crystallography, materials science, and molecular sciences.
"synopsis" may belong to another edition of this title.
Seller: PBShop.store US, Wood Dale, IL, U.S.A.
PAP. Condition: New. New Book. Shipped from UK. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # L0-9786208488246
Seller: California Books, Miami, FL, U.S.A.
Condition: New. Seller Inventory # I-9786208488246
Seller: PBShop.store UK, Fairford, GLOS, United Kingdom
PAP. Condition: New. New Book. Delivered from our UK warehouse in 4 to 14 business days. THIS BOOK IS PRINTED ON DEMAND. Established seller since 2000. Seller Inventory # L0-9786208488246
Quantity: Over 20 available
Seller: Grand Eagle Retail, Bensenville, IL, U.S.A.
Paperback. Condition: new. Paperback. This comprehensive book offers an in-depth exploration of the essential methodologies in single-crystal X-ray diffraction (SCXRD) and structural crystallography. It provides a clear, step-by-step pathway from the acquisition of raw diffraction data to the final validation of refined crystal structures. Beginning with the principles of data collection and reflection indexing, the book guides readers through the intricacies of data treatment, quality assessment, and symmetry determination. Special emphasis is placed on best practices for applying space-group analysis, refining atomic models, and ensuring the reliability of structural results.Designed to serve both as a teaching tool and a reference work, this volume is intended for graduate students, researchers, and professionals in crystallography, materials science, and molecular sciences. This item is printed on demand. Shipping may be from multiple locations in the US or from the UK, depending on stock availability. Seller Inventory # 9786208488246
Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware 88 pp. Englisch. Seller Inventory # 9786208488246
Quantity: 2 available
Seller: Books Puddle, New York, NY, U.S.A.
Condition: New. Seller Inventory # 26405263655
Seller: Majestic Books, Hounslow, United Kingdom
Condition: New. Print on Demand. Seller Inventory # 407923448
Quantity: 4 available
Seller: CitiRetail, Stevenage, United Kingdom
Paperback. Condition: new. Paperback. This comprehensive book offers an in-depth exploration of the essential methodologies in single-crystal X-ray diffraction (SCXRD) and structural crystallography. It provides a clear, step-by-step pathway from the acquisition of raw diffraction data to the final validation of refined crystal structures. Beginning with the principles of data collection and reflection indexing, the book guides readers through the intricacies of data treatment, quality assessment, and symmetry determination. Special emphasis is placed on best practices for applying space-group analysis, refining atomic models, and ensuring the reliability of structural results.Designed to serve both as a teaching tool and a reference work, this volume is intended for graduate students, researchers, and professionals in crystallography, materials science, and molecular sciences. This item is printed on demand. Shipping may be from our UK warehouse or from our Australian or US warehouses, depending on stock availability. Seller Inventory # 9786208488246
Quantity: 1 available
Seller: Biblios, Frankfurt am main, HESSE, Germany
Condition: New. PRINT ON DEMAND. Seller Inventory # 18405263661
Quantity: 4 available
Seller: buchversandmimpf2000, Emtmannsberg, BAYE, Germany
Taschenbuch. Condition: Neu. This item is printed on demand - Print on Demand Titel. Neuware -This comprehensive book offers an in-depth exploration of the essential methodologies in single-crystal X-ray diffraction (SCXRD) and structural crystallography. It provides a clear, step-by-step pathway from the acquisition of raw diffraction data to the final validation of refined crystal structures. Beginning with the principles of data collection and reflection indexing, the book guides readers through the intricacies of data treatment, quality assessment, and symmetry determination. Special emphasis is placed on best practices for applying space-group analysis, refining atomic models, and ensuring the reliability of structural results.Designed to serve both as a teaching tool and a reference work, this volume is intended for graduate students, researchers, and professionals in crystallography, materials science, and molecular sciences.VDM Verlag, Dudweiler Landstraße 99, 66123 Saarbrücken 88 pp. Englisch. Seller Inventory # 9786208488246
Quantity: 1 available