半导体器件中的辐射效应 CMOS工艺到新型的薄膜SOI工艺器件工艺到结构设计多类型辐射检测抗辐射CMOS单光子成像仪 - Softcover

Iniewski ( KE RI SHEN TUO FU ? YIN NIU SI JI ) LIU CHAO MING DENG YI [ JIA ] Krzysztof

 
9787121425523: 半导体器件中的辐射效应 CMOS工艺到新型的薄膜SOI工艺器件工艺到结构设计多类型辐射检测抗辐射CMOS单光子成像仪

Synopsis

Industry Industry Press The content of this book mainly introduces the behavior and effects of various advanced electronic devices in the radiation environment (aerospace. nuclear p...

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