Paperback. Pub Date :2007-06-01 Publisher: China Electric Power Press Limited only genuine brand new book No picture can look at Baidu the check book title ISBN pricing Publishing House information; only puerile - you can not counter-offer not free open textbook amount of the invoice is not taxed. books dedicated machine-printed invoices.
"synopsis" may belong to another edition of this title.
Shipping:
US$ 15.00
From China to U.S.A.
Seller: liu xing, Nanjing, JS, China
paperback. Condition: New. Ship out in 2 business day, And Fast shipping, Free Tracking number will be provided after the shipment.Paperback. Pub Date: 2007 Pages: 232 in Publisher: China Electric Power Press Ordinary Higher Education Eleventh Five-Year Plan textbooks: digital circuit experiment and curriculum design guidance book is divided into three chapters. the main contents include: digital electronic The technical basic experiments; digital electronic technology applied topics EDA experimental design; digital electronic technology. Regular higher education Eleventh Five-Year Plan textbooks: digital circuit experiment and curriculum design instructions set out in the basic experiment number system for digital circuits. the gate to the AD. DA converter and CPLD programming experiment. arranged the order of from simple to complex. according to the teaching-learning process. step by step. Designing issues. both practical and versatile. there are interesting and advanced. The topics have been experimental demonstration. Components TTL74LS series of large. medium and small-scale integrated circuit-based experiments. taking into account the CMOS circuit. Ordinary higher education Eleventh Five-Year Plan textbooks: digital circuit experiment and curriculum design guide book as a professional teaching colleges Electrical Engineering and Automation. automation. electronics. reference can also be designed as an electronic engineering technicians book. Contents: Preface Chapter digital electronic technology experiment experiment a number system and semiconductor devices. basic knowledge of experimental two circuit experiments of three TTLCMOS gate parameters testing laboratories the four OC gate and the tri-state gate application experiments five decoder and encoder experiment six half adder. full adder and data selector distributor experiments the seven triggers experiment eight counter experiment nine register sequential pulse generator shift register Experiment 10 Experiment 11 count. decode and display the experimental X The two read-write memory experiment thirteen pulse generation and shaping experiments 140 555 timer circuit and its application experiment 15 digital-to-analog converter experiment 16 analog-to-digital converter experiment Chapter II digital 17 programmable logic devices electronic technology applications subject design issues the ten turned two arithmetic circuit design issues digital electronic clock logic circuit design issues traffic light control logic circuit design issues four-speed measurement six quiz show the five digital logic circuit design issues cymometer logic circuit design issues Responder twelve eight timing controller logic circuit design issues of the logic circuit design issues seven copiers logic control circuit design issues nine pulse button phone display logic circuit design issues. ping-pong game consoles logic circuit design issues 11 football game consoles logic circuit design issues 14 variety of waveform generator circuit design issues 15 Kam multiplier logic circuit design issues and 16 pulse phase modulator control circuit design issues with fan control logic circuit design issues 13 with GAL stepper motor pulse distributor 18 a machine minimum system logic circuit design issues 19. CNC circuit design issues 17 Taximeter control circuit design issues point by point comparison linear interpolation logic circuit design Chapter digital electronic technology EDA Experiment Section I Overview Chapter two ALTERA development environment using the Getting Started section III digital electronic technology EDA experiment Appendices Appendix of an experimental considerations and common faults examination and exclusion Appendix II experimental integrated circuit schedule ReferencesFour Satisfaction guaranteed,or money back. Seller Inventory # NE001600
Quantity: 1 available