Language:Chinese.SoftCover.Pub Date:2012-7-1.publisher:Harbin Engineering University Press.description:Paperback. Pub Date: 2012-7-1 Pages: 109 Publisher: advantages of Harbin Engineering University Press emerging magnetic memory testing technique. known as one of the most promising non-destructive testing technology of the 21st century. with a predic
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paperback. Condition: New. Language:Chinese.Paperback. Pub Date: 2012-7-1 Pages: 109 Publisher: advantages of Harbin Engineering University Press emerging magnetic memory testing technique. known as one of the most promising non-destructive testing technology of the 21st century. with a predicted life expectancy of ferromagnetic workpieces . Magnetic memory signal processing and downhole applications from the magnetic memory testing instrument hardware design. signal multi-information processing. feature extraction and. Seller Inventory # BY075339
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