ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS Volume 43 1977

L Marton - editor:

ISBN 10: 0120146436 / ISBN 13: 9780120146437

Published by Academic Press New York 1977, 1977

About this Item

Vg (no dj, clean black cloth with gilt titles on green panel on spine, Royal Aircraft Establishment library markings else contents no fault) octavo 259pp. Electron micrograph analysis by optical transforms; Recent advances in electron beam addressed memories; Electron beams as analytical tools in surface research - LEED and AES; X-ray image intensifiers.

Seller Inventory # 5850

Bibliographic Details

• Title: ADVANCES IN ELECTRONICS AND ELECTRON PHYSICS Volume 43 1977
• Publisher: Academic Press New York 1977
• Publication Date: 1977
• Language: English
• ISBN 10: 0120146436
• ISBN 13: 9780120146437
• Binding: Hard Cover

About this title

Synopsis

This volume contains review articles covering a broad range of topics in image processing and analysis. The topics covered include image analysis - which has united and harmonized a host of heterogeneous material; contemporary approaches to the Fourier transform; number theoretic transforms, which are particularly attractive for discrete, finite signals; the use of the Wigner distribution - which encodes both spatial and spectral information, for image filtering; and applications of the concept of information energy. These up-to-date surveys are intended to provide the reader with access to the latest results in the extremely active field of image science.