Aberration-Corrected Analytical Tranmission Electron Microscopy

Language: English

Published by John Wiley & Sons, 2011

0470518510 / 9780470518519

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Seller: moluna, Greven, Germanymoluna

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Electron microscopy has undergone significant developments in recent years due to the practical implementation of schemes which can diagnose and correct for the imperfections (aberrations) in both the probe-forming and the image-forming electron lenses. Thi.

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Title
Aberration-Corrected Analytical Tranmission Electron Microscopy
Author
RMD Brydson
Publisher
John Wiley & Sons
Publication year
2011
Condition
New
Binding
Hardcover
Language
English
ISBN 10
0470518510
ISBN 13
9780470518519
Dimensions
2 x 23.7 x 16

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
First itemUS$ 55.06US$ 55.06
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