Active Probe Atomic Force Microscopy

Language: English

Published by Springer, Berlin|Springer International Publishing|Springer, 2023

3031442326 / 9783031442322

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Seller: moluna, Greven, Germanymoluna

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Dieser Artikel ist ein Print on Demand Artikel und wird nach Ihrer Bestellung fuer Sie gedruckt. From a perspective of precision instrumentation, this book provides a guided tour to readers on exploring the inner workings of atomic force microscopy (AFM). Centered around AFM, a broad range of mechatronic system topics are covered including mechanics, s.

Seller Inventory # 1038610261

Title
Active Probe Atomic Force Microscopy
Author
Xia, Fangzhou|Rangelow, Ivo W.|Youcef-Toumi, Kamal
Publisher
Springer, Berlin|Springer International Publishing|Springer
Publication year
2023
Condition
New
Binding
Hardcover
Language
English
ISBN 10
3031442326
ISBN 13
9783031442322

moluna

Greven, Germany

5-star seller

AbeBooks seller since July 9, 2020

Shipping rates from Germany to U.S.A.

Item26 to 60 business days26 to 60 business days
First itemUS$ 56.97US$ 56.97
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Moluna GmbH

Engberdingdamm 27
Greven, Germany 48268