Advanced Computing in Electron Microscopy

Earl J. Kirkland

ISBN 10: 3030332594 / ISBN 13: 9783030332594

Published by Springer International Publishing, Springer Nature Switzerland, 2020

About this Item

Druck auf Anfrage Neuware - Printed after ordering - This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

Seller Inventory # 9783030332594

Bibliographic Details

• Title: Advanced Computing in Electron Microscopy
• Publisher: Springer International Publishing, Springer Nature Switzerland
• Publication Date: 2020
• Language: English
• ISBN 10: 3030332594
• ISBN 13: 9783030332594
• Binding: Buch
• Edition: 3rd Edition
• Condition: Neu
• Dimensions: 241W x 160H x 26D millimeters 241 millimeters width by 160 millimeters height by 26 millimeters depth
• Weight: 717 grams

About this title

Synopsis

This updated and revised edition of a classic work provides a summary of methods for numerical computation of high resolution conventional and scanning transmission electron microscope images. At the limits of resolution, image artifacts due to the instrument and the specimen interaction can complicate image interpretation. Image calculations can help the user to interpret and understand high resolution information in recorded electron micrographs. The book contains expanded sections on aberration correction, including a detailed discussion of higher order (multipole) aberrations and their effect on high resolution imaging, new imaging modes such as ABF (annular bright field), and the latest developments in parallel processing using GPUs (graphic processing units), as well as updated references. Beginning and experienced users at the advanced undergraduate or graduate level will find the book to be a unique and essential guide to the theory and methods of computation in electron microscopy.

About the Author

Earl J. Kirkland graduated from Case Western Reserve University with a BS in Physics, and from Cornell University with a PhD in Applied Physics. He currently teaches in the Applied Physics Department at Cornell.