Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices

Michael Levinshtein (u. a.)

ISBN 10: 1402021690 / ISBN 13: 9781402021695

Published by Springer Netherland, 2004

About this Item

Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices | Michael Levinshtein (u. a.) | Taschenbuch | ix | Englisch | 2004 | Springer Netherland | EAN 9781402021695 | Verantwortliche Person für die EU: Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg, juergen[dot]hartmann[at]springer[dot]com | Anbieter: preigu.

Seller Inventory # 102161697

Bibliographic Details

• Title: Advanced Experimental Methods for Noise Research in Nanoscale Electronic Devices
• Publisher: Springer Netherland
• Publication Date: 2004
• Language: English
• ISBN 10: 1402021690
• ISBN 13: 9781402021695
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 21D millimeters 235 millimeters width by 155 millimeters height by 21 millimeters depth
• Weight: 575 grams
• Seller catalogs:
  • Bücher

About this title

Synopsis

A discussion of recently developed experimental methods for noise research in nanoscale electronic devices, conducted by specialists in transport and stochastic phenomena in nanoscale physics. The approach described is to create methods for experimental observations of noise sources, their localization and their frequency spectrum, voltage-current and thermal dependences. Our current knowledge of measurement methods for mesoscopic devices is summarized to identify directions for future research, related to downscaling effects.

The directions for future research into fluctuation phenomena in quantum dot and quantum wire devices are specified. Nanoscale electronic devices will be the basic components for electronics of the 21st century. From this point of view the signal-to-noise ratio is a very important parameter for the device application. Since the noise is also a quality and reliability indicator, experimental methods will have a wide application in the future.