Advanced Mathematical and Computational Tools in Metrology and Testing XI

Forbes, Alistair B. (EDT); Zhang, Nien Fan (EDT); Chunovkina, A. (EDT); Eichstadt, S. (EDT); Pavese, Franco (EDT)

ISBN 10: 9813274298 / ISBN 13: 9789813274297

Published by World Scientific Publishing Co, 2018

About this Item

Seller Inventory # 33927261-n

Bibliographic Details

• Title: Advanced Mathematical and Computational Tools in Metrology and Testing XI
• Publisher: World Scientific Publishing Co
• Publication Date: 2018
• Language: English
• ISBN 10: 9813274298
• ISBN 13: 9789813274297
• Binding: Hardcover
• Condition: New

About this title

Synopsis

This volume contains original, refereed contributions by researchers from institutions and laboratories across the world that are involved in metrology and testing. They were adopted from presentations made at the eleventh edition of the Advanced Mathematical and Computational Tools Metrology conference held at the University of Strathclyde, Glasgow, in September, organized by IMEKO Technical Committee 21, the National Physical Laboratory, UK, and the University of Strathclyde. The papers present new modeling approaches, algorithms and computational methods for analyzing data from metrology systems and evaluation measurement uncertainty, and describe their applications in a wide range of measurement areas. This volume is useful to all researchers, engineers and practitioners who need to characterize the capabilities of measurement systems and evaluate measurement data. Through the papers written by experts working in leading institutions, it covers the latest computational approaches and describes applications to current measurement challenges in engineering, environment and life sciences.