Advanced Research in Applied Artificial Intelligence: 25th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, Iea/Aie 2012, Dalian, China, June 9-12,

Jiang, He (Editor)/ Ding, Wei (Editor)/ Ali, Moonis (Editor)/ Wu, Xindong (Editor)

ISBN 10: 3642310869 / ISBN 13: 9783642310867

Published by Springer-Verlag New York Inc, 2012

About this Item

848 pages. 9.21x6.14x1.68 inches. In Stock.

Seller Inventory # x-3642310869

Bibliographic Details

• Title: Advanced Research in Applied Artificial Intelligence: 25th International Conference on Industrial Engineering and Other Applications of Applied Intelligent Systems, Iea/Aie 2012, Dalian, China, June 9-12,
• Publisher: Springer-Verlag New York Inc
• Publication Date: 2012
• Language: English
• ISBN 10: 3642310869
• ISBN 13: 9783642310867
• Binding: Paperback
• Condition: Brand New
• Weight: 1.26 kilograms

About this title

Synopsis

This volume constitutes the thoroughly refereed conference proceedings of the 25th International Conference on Industrial Engineering and Other Applications of Applied Intelligend Systems, IEA/AIE 2012, held in Dalian, China, in June 2012. The total of 82 papers selected for the proceedings were carefully reviewed and selected from numerous submissions. The papers are organized in topical sections on machine learning methods; cyber-physical system for intelligent transportation applications; AI applications; evolutionary algorithms, combinatorial optimization; modeling and support of cognitive and affective human processes; natural language processing and its applications; social network and its applications; mission-critical applications and case studies of intelligent systems; AI methods; sentiment analysis for asian languages; aspects on cognitive computing and intelligent interaction; spatio-temporal datamining, structured learning and their applications; decision making and knowledge based systems; pattern recognition; agent based systems; decision making techniques and innovative knowledge management; machine learning applications.