Advanced Scanning Electron Microscopy and X-Ray Microanalysis

Newbury Dale E. Joy David C. Goldstein Joseph Fiori C.E. Echlin Patrick

ISBN 10: 0306421402 ISBN 13: 9780306421402
Published by Springer, 1986
Language: English
Condition: New Hardcover

Sold by Biblios, Frankfurt am main, HESSE, Germany

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