Advanced Test Methods for SRAMs

Alberto Bosio

ISBN 10: 1489983147 / ISBN 13: 9781489983145

Published by Springer US, Springer New York Sep 2014, 2014

About this Item

This item is printed on demand - Print on Demand Titel. Neuware -Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book.Springer-Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 188 pp. Englisch.

Seller Inventory # 9781489983145

Bibliographic Details

• Title: Advanced Test Methods for SRAMs
• Publisher: Springer US, Springer New York Sep 2014
• Publication Date: 2014
• Language: English
• ISBN 10: 1489983147
• ISBN 13: 9781489983145
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 11D millimeters 235 millimeters width by 155 millimeters height by 11 millimeters depth
• Weight: 295 grams

About this title

Synopsis

Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called "static faults," but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as "dynamic faults", are not covered by classical test solutions and require the dedicated test sequences presented in this book.

From the Back Cover

Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

by:

Alberto Bosio

Luigi Dilillo

Patrick Girard

Serge Pravossoudovitch

Arnaud Virazel

Modern electronics depends on nanoscaled technologies that present new challenges in terms of testing and diagnosis. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnosis of the latest generation of SRAM, one of the most widely used type of memories. Classical methods for testing memory are designed to handle the so-called "static faults", but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new faults, referred to as "dynamic faults", are not covered by classical algorithms and require the dedicated test and diagnosis solutions presented in this book.

• First book to present complete, state-of-the-art coverage of dynamic fault testing for SRAM memories;
• Presents content using a "bottom-up" approach, from the study of the electrical causes of malfunctions up to the generation of smart test strategies;
• Includes case studies covering all memory components (core-cells, address decoders, write drivers, sense amplifiers, etc.);
• Proposes an exhaustive analysis of resistive-open defects in each memory component and the resulting dynamic fault modeling.