Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies

Language: English

Published by SPRINGER NATURE Nov 2009, 2009

1441909370 / 9781441909374

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -Modern electronics depend on nanoscaled technologies that present new challenges in terms of testing and diagnostics. Memories are particularly prone to defects since they exploit the technology limits to get the highest density. This book is an invaluable guide to the testing and diagnostics of the latest generation of SRAM, one of the most widely applied types of memory. Classical methods for testing memory are designed to handle the so-called 'static faults,' but these test solutions are not sufficient for faults that are emerging in the latest Very Deep Sub-Micron (VDSM) technologies. These new fault models, referred to as 'dynamic faults', are not covered by classical test solutions and require the dedicated test sequences presented in this book. 171 pp. Englisch.

Seller Inventory # 9781441909374

Title
Advanced Test Methods for Srams: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Author
Alberto Bosio
Publisher
SPRINGER NATURE Nov 2009
Publication year
2009
Condition
Neu
Binding
Buch
Language
English
ISBN 10
1441909370
ISBN 13
9781441909374
Item weight
431 grams
Dimensions
241x165x23 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

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BuchWeltWeit Ludwig Meier e.K.

Germany