New.SoftCover International edition. Different ISBN and Cover image but contents are same as US edition.Expediting shipping for all USA and Europe orders excluding PO Box. Excellent Customer Service.

Seller Inventory # ABEOCT25-361417

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Bibliographic Details

Title: Advanced VLSI Design and Testability Issues (Original Price � 42.99)
Binding: Soft cover
Edition: International Edition
Condition: Brand New

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Basi6 International LLC
1018 Camino Lago, Irving, TX, 75039, U.S.A.

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Order quantity	5 to 14 business days	3 to 6 business days
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