Advances in Pattern Recognition

Francesc J. Ferri

ISBN 10: 3540679464 / ISBN 13: 9783540679462

Published by Springer, Springer Aug 2000, 2000

About this Item

This item is printed on demand - Print on Demand Titel. Neuware -This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 792 pp. Englisch.

Seller Inventory # 9783540679462

Bibliographic Details

• Title: Advances in Pattern Recognition
• Publisher: Springer, Springer Aug 2000
• Publication Date: 2000
• Language: English
• ISBN 10: 3540679464
• ISBN 13: 9783540679462
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 43D millimeters 235 millimeters width by 155 millimeters height by 43 millimeters depth
• Weight: 1177 grams

About this title

Synopsis

This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.