Advances in Pattern Recognition : Joint IAPR International Workshops, SSPR'98 and SPR'98, Sydney, Australia, August 11-13, 1998, Proceedings. This item is unavailable.
Language: English
Published by Springer, Berlin, Springer, 1998
- Softcover
- New

Seller: AHA-BUCH GmbH, Einbeck, GermanyAHA-BUCH GmbH
AbeBooks seller since August 14, 2006
Condition: New
US$ 181.63
Item description from seller
Neuware - This book constitutes the joint refereed proceedings of the two IAPR International Workshops on Structural and Syntactic Pattern Recognition and on Statistical Techniques in Pattern Recognition, SSPR'98 and SPR'98, held in Sydney, Australia, in August 1998.The book presents 107 revised full papers selected from 134 submissions. Also included are six invited presentations. The papers are organized in topical sections on structural matching and grammatical inference, recognition of 2D and 3D objects, document image analysis and recognition, handwritten character recognition, shape representation and image segmentation, learning methodologies, feature selection and extraction, statistical classification techniques, statistical pattern recognition, and rejection in pattern recognition.
Seller Inventory # 9783540648581
- Title
- Advances in Pattern Recognition : Joint IAPR International Workshops, SSPR'98 and SPR'98, Sydney, Australia, August 11-13, 1998, Proceedings
- Author
- Adnan Amin
- Publisher
- Springer, Berlin, Springer
- Publication year
- 1998
- Condition
- Neu
- Binding
- Taschenbuch
- Language
- English
- ISBN 10
- 3540648585
- ISBN 13
- 9783540648581
- Item weight
- 1,318 grams
- Dimensions
- 235x188x35 mm
The book presents 107 revised full papers selected from 134 submissions. Also included are six invited presentations. The papers are organized in topical sections on structural matching and grammatical inference, recognition of 2D and 3D objects, document image analysis and recognition, handwritten character recognition, shape representation and image segmentation, learning methodologies, feature selection and extraction, statistical classification techniques, statistical pattern recognition, and rejection in pattern recognition.
"Synopsis" may belong to another edition of this title.