Advances in Scanning Probe Microscopy

Language: English

Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2000, 2000

3540667180 / 9783540667186

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This item is printed on demand - Print on Demand Titel. Neuware -There have been many books published on scanning tunneling microscopy (STM), atomic force microscopy (AFM) and related subjects since Dr. Cerd Binnig and Dr. Heinrich Rohrer invented STM in 1982 and AFM in 1986 at IBM Research Center in Zurich, Switzerland. These two techniques, STM and AFM, now form the core of what has come to be called the 'scanning probe microscopy (SPM)' family. SPM is not just the most powerful microscope for scientists to image atoms on surfaces, but is also becoming an indispensable tool for manipulating atoms and molecules to construct man-made materials and devices. Its impact has been felt in various fields, from surface physics and chemistry to nano-mechanics, nano-electronics and medical science. Its influence will surely extend further as the years go by, beyond the reach of our present imagination, and new research applications will continue to emerge. This book, therefore, is not intended to be a comprehensive review or textbook on SPM. Its aim is to cover only a selected part of the active re search fields of SPM and related topics in which I have been directly involved over the years. These include the basic principles of STM and AFM, and their applications to fullerene film growth, SiC surface reconstructions, MBE (molecular beam epitaxy) growth of CaAs, atomic scale manipulation of Si surfaces and meso scopic work function.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 360 pp. Englisch.

Seller Inventory # 9783540667186

Title
Advances in Scanning Probe Microscopy
Author
Y. Watanabe
Publisher
Springer Berlin Heidelberg, Springer Berlin Heidelberg Mär 2000
Publication year
2000
Condition
Neu
Binding
Buch
Language
English
ISBN 10
3540667180
ISBN 13
9783540667186
Item weight
705 grams
Dimensions
241x160x24 mm

buchversandmimpf2000

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