Advances in X-Ray Analysis (Paperback)

William M. Mueller

ISBN 10: 1468474030 / ISBN 13: 9781468474039

Published by Springer-Verlag New York Inc., New York, NY, 2012

About this Item

Paperback. It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt edly be influenced by today's extremely low- and very high-tem perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame nable to pathological and physiological diagnosis. The experi mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems. It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com munity, a versatility limited only by the imagination and inge nuity of the scientist, the designer of X-ray equipment, and the novice or student. Shipping may be from multiple locations in the US or from the UK, depending on stock availability.

Seller Inventory # 9781468474039

Bibliographic Details

• Title: Advances in X-Ray Analysis (Paperback)
• Publisher: Springer-Verlag New York Inc., New York, NY
• Publication Date: 2012
• Language: English
• ISBN 10: 1468474030
• ISBN 13: 9781468474039
• Binding: Paperback
• Condition: new

About this title

Synopsis

It is interesting to observe the ever increasing versatility of X-ray analysis as evidenced by the wide range of application to the myriads of problems confronting the technological com­ munity, a versatility limited only by the imagination and inge­ nuity of the scientist, the designer of X-ray equipment, and the novice or student. Tomorrow's engineering alloys will undoubt­ edly be influenced by today's extremely low- and very high-tem­ perature X-ray research. New and continued insight into the basic architecture of crystalline materials is being achieved by studies of lattice imperfection, recrystallization habit, and phase transformation. Techniques for identification and analysis of minerals by X-ray diffraction and fluorescence are equally ame­ nable to pathological and physiological diagnosis. The experi­ mental setup of this month may well become an instrument for routine process control next month. And such developments occur so rapidly iIi so many different laboratories that it is difficult to keep abreast of this tidal wave of information. The dictates of this nation's economy and its struggle for technological supremacy demand a full awareness of the ac­ complishments of one's associates. Such awareness is most effectively obtained through personal contact. where the beginner can benefit from the experiences of the expert, the basic re­ searcher and the applied researcher can exchange views, and the creative research of each is nurtured by the sharing of mutual or associated problems.