Advances in X-Ray Analysis Volume 15. Proceedings of the twentieth annual conference on applications of x-ray analysis held August 11-13, 1971

Kurt F. J. Heinrich, Charles S. Barrett, John B. Newkirk, Clayton O. Ruud, editors

ISBN 10: 030638115X / ISBN 13: 9780306381157

Published by Plenum, 1972

About this Item

574 pp., Hardcover, ex library, else text clean and binding tight. - If you are reading this, this item is actually (physically) in our stock and ready for shipment once ordered. We are not bookjackers. Buyer is responsible for any additional duties, taxes, or fees required by recipient's country.

Seller Inventory # ZB887288

Bibliographic Details

• Title: Advances in X-Ray Analysis Volume 15. Proceedings of the twentieth annual conference on applications of x-ray analysis held August 11-13, 1971
• Publisher: Plenum
• Publication Date: 1972
• Language: English
• ISBN 10: 030638115X
• ISBN 13: 9780306381157
• Binding: Hardcover
• Condition: Good

About this title

Synopsis

The application of solid-state detectors of high energy resolution to x-ray spectrometry, and the increasing use of compu ters in both measurement and data evaluation, are giving a new stimulus to x-ray techniques in analytical chemistry. The Twentieth Annual Denver X-ray Conference reflects this renewed interest in several ways. The invited papers, grouped in Session I, review the charac teristics of the detectors used in the measurement of x-rays. One paper is dedicated to the detection of single io.ns. Although such a subject may appear to be marginal to the purposes of the Denver Conference, we must recognize the affinity of techniques applied to similar purposes. Ion probe mass spectrometry is dedicated to tasks similar to those performed by x-ray spectrometry with the electron probe microanalyzer. Scientists and technologists will see these two techniques discussed in the same meetings. The discussion of automation and programming is not limited to the two invited speakers, but extends to papers presented in more than one session. The matter of fluorescence analysis by isotope- and tube-excitation will also be of great interest to those concerned with the practical applications of x-ray techniques. The communications contained in this volume, and the lively discussions which frequently followed the presentation of papers, attest to the vitality of the subjects which are the concern of the Annual Denver X-ray Conference."