Analog IC Reliability in Nanometer CMOS

Language: English

Published by Springer, Springer Jun 2015, 2015

1489986308 / 9781489986306

Series: Book 57 of 124 - Analog Circuits and Signal Processing

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This item is printed on demand - Print on Demand Titel. Neuware -This book focuses on modeling, simulation and analysis of analog circuit aging. First, all important nanometer CMOS physical effects resulting in circuit unreliability are reviewed. Then, transistor aging compact models for circuit simulation are discussed and several methods for efficient circuit reliability simulation are explained and compared. Ultimately, the impact of transistor aging on analog circuits is studied. Aging-resilient and aging-immune circuits are identified and the impact of technology scaling is discussed.The models and simulation techniques described in the book are intended as an aid for device engineers, circuit designers and the EDA community to understand and to mitigate the impact of aging effects on nanometer CMOS ICs.Springer-Verlag KG, Sachsenplatz 4-6, 1201 Wien 216 pp. Englisch.

Seller Inventory # 9781489986306

Title
Analog IC Reliability in Nanometer CMOS
Author
Elie Maricau
Publisher
Springer, Springer Jun 2015
Publication year
2015
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
1489986308
ISBN 13
9781489986306
Item weight
335 grams
Dimensions
235x155x12 mm
Series
Book 57 of 124: Analog Circuits and Signal Processing

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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AbeBooks seller since January 23, 2017

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Impressum Thorsten Retsch Buchversand Mimpf2000 Oberölschnitz 16 95517 Emtmannsberg Deutschland Telefon: 09209-2023188 Email: mimpf2000@online.de USt-ID-Nr.: DE 235096871 Wir führen gebrauchte Bücher aus allen Sparten der Literatur

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