Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits

Albert K. Lu, Gordon W. Roberts

ISBN 10: 0792395646 / ISBN 13: 9780792395645

Published by Springer US, 1995

About this Item

Zustand: Gut | Sprache: Englisch | Produktart: Bücher | Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique. The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix. The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.

Seller Inventory # 3031437/3

Bibliographic Details

• Title: Analog Signal Generation for Built-In-Self-Test of Mixed-Signal Integrated Circuits
• Publisher: Springer US
• Publication Date: 1995
• Language: English
• ISBN 10: 0792395646
• ISBN 13: 9780792395645
• Binding: Hardcover
• Condition: Gut
• Seller catalogs:
  • Bücher

About this title

Synopsis

Analog Signal Generation for Built-In-Self-Test (BIST) of Mixed-Signal Integrated Circuits is a concise introduction to a powerful new signal generation technique.
The book begins with a brief introduction to the testing problem and a review of conventional signal generation techniques. The book then describes an oversampling-based oscillator capable of generating high-precision analog tones using a combination of digital logic and D/A conversion. These concepts are then extended to multi-tone testing schemes without introducing a severe hardware penalty. The concepts are extended further to encompass piece-wise linear waveforms such as square, triangular and sawtooth waves. Experimental results are presented to verify the ideas in each chapter and finally, conclusions are drawn. For those readers unfamiliar with delta-sigma modulation techniques, a brief introduction to this subject is also provided in an appendix.
The book is ideal for test engineers, researchers and circuits designers with an interest in IC testing methods.