Title: Analysis of Sampled Imaging Systems (SPIE Tutorial Texts in Optical Engineering Vol. TT39)
Publisher: SPIE Publications
Publication Date: 2000
Language: English
ISBN 10: 0819434892
ISBN 13: 9780819434890
Binding: paperback
Condition: As New

About this title

Synopsis

Advances in solid state detector arrays, flat panel displays, and digital image processing have prompted an increasing variety of sampled imaging products and possibilities. These technology developments provide new opportunities and problems for the design engineer and system analyst--this tutorial's intended reader.

Contents

- Preface
- Introduction
- Fourier integral representation of an optical image
- Sampled imager response function
- Sampled imager design and optimization
- Interlace and Dither
- Dynamic Sampling, Resolution Enhancement, and Super-Resolution
- The Sampling Theorem
- Laboratory Measurements of Sampled Infrared Imaging System Performance
- Appendix A: Fourier integrals and Fourier series
- Appendix B: The impulse function

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