Analysis of Sampled Imaging Systems (SPIE Tutorial Texts in Optical Engineering Vol. TT39)
Language: English
Published by SPIE Publications, 2000
- Softcover
- Used

Seller: Greenworld Books, arlington, TX, U.S.A.Greenworld Books
AbeBooks seller since June 20, 2025
Condition: Used - Very good
US$ 68.25
Quantity: 1 available
Add to basketItem description from seller
Seller Inventory # GWV.0819434892.VG
- Title
- Analysis of Sampled Imaging Systems (SPIE Tutorial Texts in Optical Engineering Vol. TT39)
- Author
- Vollmerhausen, Richard H.; Driggers, Ronald G.
- Publisher
- SPIE Publications
- Publication year
- 2000
- Condition
- very_good
- Binding
- Soft cover
- Language
- English
- ISBN 10
- 0819434892
- ISBN 13
- 9780819434890
Contents
- Preface
- Introduction
- Fourier integral representation of an optical image
- Sampled imager response function
- Sampled imager design and optimization
- Interlace and Dither
- Dynamic Sampling, Resolution Enhancement, and Super-Resolution
- The Sampling Theorem
- Laboratory Measurements of Sampled Infrared Imaging System Performance
- Appendix A: Fourier integrals and Fourier series
- Appendix B: The impulse function
"Synopsis" may belong to another edition of this title.
Greenworld Books
arlington, TX, U.S.A.
AbeBooks seller since June 20, 2025
Shipping rates within U.S.A.
| Item | 4 to 8 business days | 4 to 8 business days |
|---|---|---|
| First item | US$ 0.00 | US$ 0.00 |
Payment methods
Specialty
Popular booksSeller's business information
Greenworldbooks
3703 Avenue E East
Arlington, TX U.S.A. 76011