Analytical, Approximate-Analytical and Numerical Methods in the Design of Energy Analyzers

Peter Hawkes

ISBN 10: 0128022523 / ISBN 13: 9780128022528

Published by Elsevier Inc Okt 2015, 2015

About this Item

This item is printed on demand - it takes 3-4 days longer - Neuware - Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. 242 pp. Englisch.

Seller Inventory # 9780128022528

Bibliographic Details

• Title: Analytical, Approximate-Analytical and Numerical Methods in the Design of Energy Analyzers
• Publisher: Elsevier Inc Okt 2015
• Publication Date: 2015
• Language: English
• ISBN 10: 0128022523
• ISBN 13: 9780128022528
• Binding: Buch
• Condition: Neu
• Dimensions: 229W x 152H x 14D millimeters 229 millimeters width by 152 millimeters height by 14 millimeters depth
• Weight: 494 grams

About this title

Synopsis

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

• Contains contributions from leading authorities on the subject matter
• Informs and updates on all the latest developments in the field of imaging and electron physics
• Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource
• Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

About the Author

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.