Applied Charged Particle Optics

Helmut Liebl

ISBN 10: 3642091032 / ISBN 13: 9783642091032

Published by Springer Berlin Heidelberg, 2010

About this Item

Druck auf Anfrage Neuware - Printed after ordering - Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.

Seller Inventory # 9783642091032

Bibliographic Details

• Title: Applied Charged Particle Optics
• Publisher: Springer Berlin Heidelberg
• Publication Date: 2010
• Language: English
• ISBN 10: 3642091032
• ISBN 13: 9783642091032
• Binding: Taschenbuch
• Condition: Neu
• Dimensions: 235W x 155H x 9D millimeters 235 millimeters width by 155 millimeters height by 9 millimeters depth
• Weight: 230 grams

About this title

Synopsis

Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. The book begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. The book’s wide frame of reference makes this an ideal work for researchers, engineers and graduate students alike.

From the Back Cover

Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.