Applied Charged Particle Optics
Helmut Liebl
Sold by BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
AbeBooks Seller since January 11, 2012
New - Soft cover
Condition: New
Ships from Germany to U.S.A.
Quantity: 2 available
Add to basketSold by BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, Germany
AbeBooks Seller since January 11, 2012
Condition: New
Quantity: 2 available
Add to basketThis item is printed on demand - it takes 3-4 days longer - Neuware -Written by a pioneer in the field, this overview of charged particle optics provides a solid introduction to the subject area for all physicists wishing to design their own apparatus or better understand the instruments with which they work. It begins by introducing electrostatic lenses and fields used for acceleration, focusing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. 144 pp. Englisch.
Seller Inventory # 9783642091032
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
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