Applied Charged Particle Optics
Language: English
Published by Springer, 2007
- Hardcover
- Used
Seller: Buchpark, Trebbin, GermanyBuchpark
AbeBooks seller since September 30, 2021
Condition: Used - Fine
US$ 94.94
Quantity: 1 available
Add to basketItem description from seller
Zustand: Sehr gut | Sprache: Englisch | Produktart: Bücher | Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
Seller Inventory # 3623605/12
- Title
- Applied Charged Particle Optics
- Author
- Liebl, Helmut
- Publisher
- Springer
- Publication year
- 2007
- Condition
- Sehr gut
- Binding
- Hardcover
- Language
- English
- ISBN 10
- 3540719245
- ISBN 13
- 9783540719243
- Edition
- 2nd Edition
- Seller catalogs
- Bücher
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
"Synopsis" may belong to another edition of this title.
From the Back Cover
Authored by a pioneer of the field, this overview of charged particle optics provides a solid introduction to the field for all physicists wishing to design their own apparatus or better understand the instruments with which they work. Applied Charged Particle Optics begins by introducing electrostatic lenses and fields used for acceleration, focussing and deflection of ions or electrons. Subsequent chapters give detailed descriptions of electrostatic deflection elements, uniform and non-uniform magnetic sector fields, image aberrations, and, finally, fringe field confinement. A chapter on applications is added.
"About the title" may belong to another edition of this title.
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