Applied Reliability, Third Edition
Tobias, Paul A. Paul A. Tobias, David Trindade,
Language: English
Published by Chapman and Hall/CRC -, 1994
- Hardcover
- Used

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- Title
- Applied Reliability, Third Edition
- Author
- Tobias, Paul A. Paul A. Tobias, David Trindade,
- Publisher
- Chapman and Hall/CRC -
- Publication year
- 1994
- Condition
- Very Good
- Binding
- hardcover
- Language
- English
- ISBN 10
- 0442004699
- ISBN 13
- 9780442004699
The second edition includes three completely new chapters: two cover "Repairable System Reliability" (both for renewal and non-renewal models), with an emphasis on simple graphical techniques, while also describing analytical methods for reparable system data analysis. A third new chapter surveys areas such as reliability growth modeling, Bayesian reliability analysis, and field reliability monitoring programs.
In addition, this latest edition offers hundreds of new examples, exercises, problems, and references-all designed to provide readers with additional support in understanding and applying the latest reliability testing methods.
In bringing state-of-the-art techniques down to an accessible, how-to level, the second edition of Applied Reliability will serve the practical needs of electronic, mechanical, and industrial engineers involved in the design and manufacture of components and systems, and of statisticians and scientists working on applied reliability problems. It will also be a highly suitable textbook for engineering courses in applied reliability and quality control.
"Synopsis" may belong to another edition of this title.
About the Author
Dr. David C. Trindade is the chief officer of best practices and fellow at Bloom Energy. He was previously a distinguished principal engineer at Sun Microsystems, senior director of software quality at Phoenix Technologies, senior fellow and director of reliability and applied statistics at Advanced Micro Devices, worldwide director of quality and reliability at General Instruments, and advisory engineer at IBM. He has also been an adjunct lecturer at the University of Vermont and Santa Clara University, teaching courses in statistical analysis, reliability, probability, and applied statistics. In 2008, he was the recipient of the IEEE Reliability Society’s Lifetime Achievement Award.
"About the title" may belong to another edition of this title.
Bahamut Media
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AbeBooks seller since August 15, 2012
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