Applied Scanning Probe Methods I

Language: English

Published by Springer Berlin Heidelberg Jan 2004, 2004

3540005277 / 9783540005278

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Seller: BuchWeltWeit Ludwig Meier e.K., Bergisch Gladbach, GermanyBuchWeltWeit Ludwig Meier e.K.

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This item is printed on demand - it takes 3-4 days longer - Neuware -This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques willbenefit from the international perspective assembled in the book. 500 pp. Englisch.

Seller Inventory # 9783540005278

Title
Applied Scanning Probe Methods I
Author
Bharat Bhushan
Publisher
Springer Berlin Heidelberg Jan 2004
Publication year
2004
Condition
Neu
Binding
Buch
Language
English
ISBN 10
3540005277
ISBN 13
9783540005278
Item weight
1,002 grams
Dimensions
241x160x35 mm

BuchWeltWeit Ludwig Meier e.K.

Bergisch Gladbach, Germany

5-star seller

AbeBooks seller since January 11, 2012

Shipping rates from Germany to U.S.A.

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BuchWeltWeit Ludwig Meier e.K.

Germany