Applied Scanning Probe Methods I

Language: English

Published by Springer Berlin Heidelberg, Springer Berlin Heidelberg Dez 2010, 2010

3642056024 / 9783642056024

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This item is printed on demand - Print on Demand Titel. Neuware -This volume examines the physical and technical foundation for recent progress in applied near-field scanning probe techniques. It constitutes a timely comprehensive overview of SPM applications, now that industrial applications span topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. After laying the theoretical background of static and dynamic force microscopies, including sensor technology and tip characterization, contributions detail applications such as macro- and nanotribology, polymer surfaces, and roughness investigations. The final part on industrial research addresses special applications of scanning force nanoprobes such as atomic manipulation and surface modification, as well as single electron devices based on SPM. Scientists and engineers either using or planning to use SPM techniques will benefit from the international perspective assembled in the book.Springer Verlag GmbH, Tiergartenstr. 17, 69121 Heidelberg 500 pp. Englisch.

Seller Inventory # 9783642056024

Title
Applied Scanning Probe Methods I
Author
Bharat Bhushan
Publisher
Springer Berlin Heidelberg, Springer Berlin Heidelberg Dez 2010
Publication year
2010
Condition
Neu
Binding
Taschenbuch
Language
English
ISBN 10
3642056024
ISBN 13
9783642056024
Item weight
842 grams
Dimensions
235x155x31 mm

buchversandmimpf2000

Emtmannsberg, BAYE, Germany

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